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                                                      Past Events                                     

Fall Program 2002
Focus on the Semiconductor and Microelectronics Industries


The Particle Society of Minnesota will hold its fourth annual meeting on:

Wednesday, October 9, 2002
8:00 A.M. to 4:00 pm
Radisson Hotel South, Bloomington, MN

The program this year will feature talks on particle technology related to the semiconductor and microelectronics industries. Specific topics include:

  • Chemical/mechanical polishing and slurry processing

  • Advanced particle characterization technology

  • Ultrasonic cleaning

  • Contamination free manufacturing

  • Particle detection and metrology

In addition to the talks, the Fall 2002 program will feature a number of informational exhibits from companies offering particle related equipment and services for the semiconductor and microelectronic industries.

The schedule for this Workshop is shown below.

 

Fall Program Agenda (Preliminary)

8:00 - 8:20am

On-Site Registration   (Radisson Hotel South, Bloomington, MN, Tel. 952-835-7800)

8:30 - 8:45am

Welcome and Introduction to The Particle Society of Minnesota:

Dr. Jim Marti, Aveka, Inc., President of the Particle Society

8:45 - 9:30am

Perturbation Detection Analysis: A Method for Comparing Instruments that Measure CMP Slurry Health. (Dr. Kristi Nicholes, BOC EDWARDS, Chanhassen, MN)

9:30 - 10:15am

The Application of Auger Electron Spectroscopy (AES) for Compositional Defect Review using the PHI SMART-200 & SMART-Tool  (Dr. Juergen H. Scherer, Evans PHI, Eden Prairie, MN)

10:15 - 10:30am

Break

10:30 - 11:15am

Abrasive Particles in Electronic and Semiconductor Manufacturing

(Dr.Eric Funkenbusch, 3M Super Microfinishing Systems, St. Paul, MN)

11:15am

Lunch

12:00 - 12:45pm

Special Luncheon Speaker: Particle Characterization in the Food Industry

 (Dr. Stephen Campbell, Professor of Electrical & Computer Engineering, University of MN)

12:45 - 1:30pm

Open time for viewing exhibitor booths

1:30 - 2:15pm

The Impact of Statistics on Choosing and Using a Liquid Particle Counter, and Mini-Environment Monitoring  (Particle Measuring Systems, Inc., Boulder, Colorado)

2:15 - 3:00pm

Designer Waveforms - Ultrasonics

(William Puskas, Blackstone-Ney Ultrasonics, Jamestown, NY)   

3:00 - 3:45pm

Recent Advances in Contamination Free Manufacturing

(Fred Gerbig, Gerbig Engineering Co., St. Paul, MN )

3:45 - 4:00pm Closing Remarks: David Arney, 3M, Program Chair PSOM

 


Copyright 2006, Particle Society of Minnesota